Microstructural characterizations of magnetron sputtered Ti films on glass substrate-Reference-Cited by-同舟云学术

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Microstructural characterizations of magnetron sputtered Ti films on glass substrate

Published:2009-04 Issue:7 Volume:209 Page:3444-3451
ISSN:0924-0136
Container-title:Journal of Materials Processing Technology
language:en
Short-container-title:Journal of Materials Processing Technology

Author:

Chawla Vipin,Jayaganthan R.,Chawla A.K.,Chandra Ramesh

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Metals and Alloys,Computer Science Applications,Modeling and Simulation,Ceramics and Composites

Reference31 articles.

1. An overview on the use of titanium in the aerospace industry;Boyer;Mater. Sci. Eng. A,1996

2. Surface structure and composition of flat titanium thin films as a function of film thickness and evaporation rate;Cai;Appl. Surf. Sci.,2005

3. Finite element analysis of thermal stress in magnetron sputtered Ti coating;Chawla;J. Mater. Process. Technol.,2008

4. Structural characterizations of magnetron sputtered nanocrystalline TiN thin films;Chawla;Mater. Charact.,2008

5. Structural, optical and electronic properties of nanocrystalline TiN films;Chandra;Nanotechnology,2005

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