Polishing performance and material removal mechanism in the solid-phase Fenton reaction based polishing process of SiC wafer using diamond gel disc

Author:

Xu Lanxing,Feng Kaiping,Zhao Liang,Gu Yanzhang,Zhao Tianchen,Lyu Binghai

Publisher

Elsevier BV

Reference30 articles.

1. Mechanisms of tool-workpiece interaction in ultraprecision diamond turning of single-crystal SiC for curved microstructures;Huang;Int. J. Mach. Tool. Man.,2023

2. Syntaxy and defect distribution during the bulk growth of 4H-SiC Single crystal;Patel;J. Mater. Sci. -Mater. el.,2021

3. Development of high power SiC devices for rail traction power systems;Liu;J. Cryst. Growth,2019

4. EDM mechanism of single crystal SiC with respect to thermal, mechanical and chemical aspects;Zhao;J. Mater. Process. Tech.,2016

5. Chemical-mechanical polishing of 4h silicon carbide wafers;Wang;Adv. Mater. Interfaces,2023

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