Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference40 articles.
1. RHEED and Reflection Electron Imaging of Surfaces,1988
2. Rheed intensity analysis of Si(111)7 × 7 at one-beam condition
3. Dynamical analysis of a RHEED pattern from the Si(111)-7 × 7 surface
4. STRUCTURE ANALYSIS OF ${\rm Si}(111)(\sqrt{3}\times\sqrt{3}$)–Al BY ENERGY-FILTERED RHEED
5. Analysis of RHEED data from the GaAs(001)2 × 4 surface
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