Rheed intensity analysis of Si(111)7 × 7 at one-beam condition
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference24 articles.
1. Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
2. Tunneling Images of Atomic Steps on the Si(111)7×7 Surface
3. Real-Space Observation of Surface States on Si(111) 7×7 with the Tunneling Microscope
4. New Reconstructions on Silicon (111) Surfaces
5. Atomic and electronic contributions to Si(111)-(7×7) scanning-tunneling-microscopy images
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