Anomalous behaviour in resonant Auger emission of SiOx thin films
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference39 articles.
1. Optical Properties of Silicon Monoxide in the Wavelength Region from 024 to 140 Microns*
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4. Theoretical study of the electronic structure ofSiOx
5. Study of the interfacial structure between Si (100) and thermally grown SiO2using a ball‐and‐spoke model
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