Tight-binding study of noncontact atomic force microscopy images of Si( 001 ) surfaces
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference23 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
3. Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy
4. Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM
5. Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy
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1. The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface;Nanotechnology;2009-06-10
2. Non-contact Atomic Force Microscopy Simulations of Hydrogen-terminated Si(100) Surfaces with a Methyl;Journal of Physics: Conference Series;2007-04-01
3. Probing theSi(001)surface with a Si tip: Anab initiostudy;Physical Review B;2006-06-19
4. Origin ofp(2×1)Phase on Si(001) by Noncontact Atomic Force Microscopy at 5 K;Physical Review Letters;2006-03-16
5. Non-contact AFM images of a C60 molecule adsorbed on the Si(001) surface: An ab initio method;Surface Science;2006-02
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