The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface-Reference-Cited by-同舟云学术

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The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface

Published:2009-06-10 Issue:26 Volume:20 Page:264011
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Naitoh Yoshitaka,Kinoshita Yukinori,Jun Li Yan,Kageshima Masami,Sugawara Yasuhiro

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/20/i=26/a=264011/pdf

Reference28 articles.

1. Vertical and lateral force mapping on theSi(111)−(7×7)surface by dynamic force microscopy

2. Electrostatic force spectroscopy of near surface localized states

3. The Force Needed to Move an Atom on a Surface

4. Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy

5. Noncontact Atomic Force Microscopy

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1. Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy;Nanomaterials;2020-07-31

2. Contrast inversion of O adatom on rutile TiO2(1 1 0)-(1 × 1) surface by atomic force microscopy imaging;Applied Surface Science;2020-03

3. Imaging oxygen molecular adsorption and dissociation on the Ti site of rutile TiO2(110) surface with real configuration at 78 K by atomic force microscopy;Physical Chemistry Chemical Physics;2020

4. Identification of Atomic Defects and Adsorbate on Rutile TiO2(110)-(1 × 1) Surface by Atomic Force Microscopy;The Journal of Physical Chemistry C;2019-09-30

5. Atomic-Scale Elastic Property Probed by Atomic Force Microscopy;Comprehensive Nanoscience and Nanotechnology;2019

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