Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium-Reference-Cited by-同舟云学术

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Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium

Published:2003-05 Issue:2 Volume:531 Page:95-102
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Tolstogouzov A.,Daolio S.,Pagura C.,Greenwood C.L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference46 articles.

1. Low-energy ion scattering at surfaces

2. Science of Ceramic Interfaces II;Brongersma,1994

3. Wiley Series in Ion Chemistry and Physics,1994

4. Application of Ion Scattering for Analysis of Solids;Mashkova,1995

5. Inelastic Ion–Surface Collisions;Rusch,1977

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