Charging of dielectrics under ion irradiation-Reference-Cited by-同舟云学术

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Charging of dielectrics under ion irradiation

Published:2020-07 Issue: Volume:177 Page:109373
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Rau E.I.,Tatarintsev A.A.,Zykova E.Yu.,Markovets (Ozerova) K.E.,Minnebaev K.F.

Funder

Russian Foundation for Basic Research

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference31 articles.

1. Helium Ion Microscopy,2016

2. Helium ion beam induced electron emission from insulating silicon nitride films under charging conditions;Petrov;Nucl. Instrum. Methods Phys. Res. B,2018

3. Modeling of charging effects in scanning ion microscopes;Ohya;Proc. SPIE,2010

4. Mechanisms of charging of insulators under irradiation with medium-energy electron beams;Rau;Phys. Solid State,2008

5. An experimental approach for dynamic investigation of the trapping properties of glass-ceramic under electron beam irradiation from a scanning electron microscope;Fakhfakh;Eur. Phys. J. Appl. Phys.,2003

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2. Effect of Bias Potential on the Interface of a Solid Electrolyte and Electrode during XPS Depth Profiling Analysis;ACS Applied Materials & Interfaces;2024-05-08

3. Method for Measuring the Dielectrics Charging Potential under Ion Irradiation Using Shifting the Bremsstrahlung Edge;Technical Physics;2024-01

4. Scattering and ion emission from insulator films;Seriya 3: Fizika, Astronomiya;2023-06-02

5. Neutralization of the Surface Charge of an Insulated Target under the Interaction of High-Energy Metal Ion Beams;Quantum Beam Science;2023-05-29

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