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Effect of Bias Potential on the Interface of a Solid Electrolyte and Electrode during XPS Depth Profiling Analysis

  • Published:2024-05-08 Issue:20 Volume:16 Page:26922-26931
  • ISSN:1944-8244
  • Container-title:ACS Applied Materials & Interfaces
  • language:en
  • Short-container-title:ACS Appl. Mater. Interfaces

Author:

Seo Minsik1,Lee Yonghee2ORCID,Shin Hyunsuk1,Kim Eunji2,Kim Hyun-Suk3,Chung Kwun-Bum4,Kim Gyungtae5,Mun Bongjin Simon1ORCID

Affiliation:

1. Department of Physics and Photon Science, Gwangju Institute of Science & Technology (GIST), Gwangju 61005, Republic of Korea

2. Center for Nano Material Technology Development, National NanoFab Center (NNFC), Daejeon 34141, Republic of Korea

3. Department of Energy and Materials Engineering, Dongguk University, Seoul 04620, Republic of Korea

4. Division of Physics and Semiconductor Science, Dongguk University, Seoul 04620, Republic of Korea

5. Department of Measurement & Analysis, National NanoFab Center (NNFC), Daejeon 34141, Republic of Korea

Funder

Korea Semiconductor Research Consortium

National Research Foundation of Korea

Korea Institute of Energy Technology Evaluation and Planning

Publisher

American Chemical Society (ACS)

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