Characterizing SRAM and FF soft error rates with measurement and simulation

Author:

Hashimoto Masanori,Kobayashi Kazutoshi,Furuta Jun,Abe Shin-Ichiro,Watanabe Yukinobu

Funder

Japan Science and Technology Agency

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference108 articles.

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