Robust power grid network design considering EM aging effects for multi-segment wires-Reference-Cited by-同舟云学术

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Robust power grid network design considering EM aging effects for multi-segment wires

Published:2021-03 Issue: Volume:77 Page:38-47
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Zhou Han^ORCID,Chen Liang,Tan Sheldon X.-D.

Funder

National Science Foundation

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference34 articles.

1. Reliable power grid network design framework considering EM immortalities for multi-segment wires;Zhou,2020

2. IEEE International Roadmap for Devices and Systems (IRDS),2018

3. International Technology Roadmap for Semiconductors 2.0 (ITRS 2.0),2015

4. Electromigration-A brief survey and some recent results;Black;IEEE Trans. Electron. Dev.,1969

5. Circuits, Interconnections, and Packaging for VLSI;Bakoglu,1990

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1. GridVAE: Fast Power Grid EM-Aware IR Drop Prediction and Fixing Accelerated by Variational AutoEncoder;2024 25th International Symposium on Quality Electronic Design (ISQED);2024-04-03

2. Recent Progress in Physics-Based Modeling of Electromigration in Integrated Circuit Interconnects;Micromachines;2022-05-31

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