Funder
Engineering and Physical Sciences Research Council
Subject
Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference44 articles.
1. L. A. Giannuzzi, B. W. Kempshall, S.M. Schwarz, J.K. Lomness, B.I. Prenitzer, and F. A. Stevie. FIB Lift-out Specimen Preparation Techniques, pages 201–228. Springer US, Boston, MA
2. In situ hydride formation in titanium during focused ion milling;Rengen;J. electron Microsc.,2010
3. Focused ion beam induced surface amorphization and sputter processes;Basnar;J. Vac. Sci. Technol. B,2003
4. Ion-beam-induced amorphization and recrystallization in silicon;Lourdes;J. Appl. Phys.,2004
5. Focused-ion-beam-inflicted surface amorphization and gallium implantation—new insights and removal by focused-electron-beam-induced etching;Roediger;Nanotechnology,2011
Cited by
43 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献