Preparation of damage-free kerogen specimen for microscopy: Understanding the damage mechanisms induced by ion milling techniques
-
Published:2024-03
Issue:
Volume:234
Page:212607
-
ISSN:2949-8910
-
Container-title:Geoenergy Science and Engineering
-
language:en
-
Short-container-title:Geoenergy Science and Engineering
Author:
Xie Yujun,
Huang Xi,
Aldajani SaleemORCID,
Vo Hi T.,
Jorgens Danielle M.ORCID,
Abousleiman Younane,
Hull KatherineORCID,
Hosemann Peter