Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis-Reference-Cited by-同舟云学术

Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis

Published:2020-12 Issue: Volume:201 Page:72-78
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Henry Loïc,Bernier Nicolas,Jacob Martin,Navarro Gabriele^ORCID,Clément Laurent,Rouvière Jean-Luc,Robin Eric^ORCID

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference37 articles.

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5. A High Performance Phase Change Memory with Fast Switching Speed and High Temperature Retention by Engineering the GexSbyTezphase Change Material;Cheng,2011

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