Evolution of the microstructure of Sn–Ag–Cu solder joints exposed to ultrasonic waves during solidification

Author:

Chinnam R.K.,Fauteux C.,Neuenschwander J.,Janczak-Rusch J.

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. In: Lead-free electronic solders;Frear,2007

2. Sun Y;Teo;Acta Mater,2008

3. Advanced packaging;Tu;IEEE Trans,2001

4. Physics and materials challenges for lead-free solders

5. Shangguan D. Lead-free solder interconnect reliability. Metals Park, OH: ASM International; 2005.

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