Electronic driver with amplitude and quality factor control to adjust the response of quartz tuning fork sensors in atomic force microscopy applications

Author:

González Laura,Otero Jorge,Cabezas Gonzalo,Puig-Vidal Manel

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. Atomic force microscopy;Binnig;Physical Review Letters,1986

2. Metrological atomic force microscope with self-sensing measuring head;Zhao;Sensors and Actuators A,2011

3. A probe-positioning method with two-dimensional calibration pattern for micro-multi-point probes;Yashiro;Review of Scientific Instruments,2003

4. Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes;Wutscher;Review of Scientific Instruments,2011

5. Multirobot control system design for nanomanipulation applications;Otero;International Journal of Factory Automation, Robotics and Soft Computing,2008

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