Measurement of longitudinal piezoelectric coefficient of film with scanning-modulated interferometer-Reference-Cited by-同舟云学术

Measurement of longitudinal piezoelectric coefficient of film with scanning-modulated interferometer

Published:2006-04 Issue:2 Volume:128 Page:327-332
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Wang Zhihong,Zhu Weiguang,Miao Jianmin,Chao Chen,Tan Ooi Kiang

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference9 articles.

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2. A sensitive double beam laser interferometer for studying high frequency piezoelectric and electrostrictive strains;Pan;Rev. Sci. Instrum.,1989

3. Simple, high-resolution interferometer for the measurement of frequency dependent complex piezoelectric response in ferroelectric ceramics;Li;Rev. Sci. Instrum.,1995

4. Modulated laser interferometer with picometer resolution for piezoelectric characterization;Chao;Rev. Sci. Instrum.,2004

5. Measurement of longitudinal piezoelectric coefficient of thin films by a laser-scanning vibrometer;Yao;IEEE Trans Ultrason. Ferroelectr. Freq. Control.,2003

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