Ion beam sputtered Ge–Si–O amorphous thin films for microbolometer infrared detectors and their application in earth sensors-Reference-Cited by-同舟云学术

Ion beam sputtered Ge–Si–O amorphous thin films for microbolometer infrared detectors and their application in earth sensors

Published:2013-04 Issue: Volume:192 Page:81-91
ISSN:0924-4247
Container-title:Sensors and Actuators A: Physical
language:en
Short-container-title:Sensors and Actuators A: Physical

Author:

Sumesh M.A.,Karanth Shivaprasada,Prakash Sharadadevi,Laxmiprasad A.S.,Nagendra C.L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference43 articles.

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5. E.L. Karlson, J.V. Kiernan, N.Y. Yonkers, Immersed Bolometers and Immersion Glasses Therefor, United States Patent, Patent Number: 3,121,208 (1964).

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