Author:
Mulloni V.,Giacomozzi F.,Margesin B.
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. Techniques in residual stress measurement for MEMS and their applications;Chen,2007
2. RF-MEMS SPDT switch on silicon substrate for space applications;Farinelli,2004
3. Deformation characteristics of electroplated MEMS cantilever beams released by plasma ashing;Kang;Sens. Actuators A: Phys.,2008
4. Dry etching of Cr2O3/Cr stacked film during resist ashing by oxygen plasma;Tonotani;Jpn. J. Appl. Phys.,2005
5. Realization of low-stress Au cantilever beams;Stanec;J. Micromech. Microeng.,2007
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