Site-specific ion desorption from condensed F3SiCD2CH2Si(CH3)3 induced by Si-2p core-level ionizations studied with photoelectron photoion coincidence (PEPICO) spectroscopy, Auger photoelectron coincidence spectroscopy (APECS) and Auger electron photoion coincidence (AEPICO) spectroscopy-Reference-Cited by-同舟云学术

Site-specific ion desorption from condensed F3SiCD2CH2Si(CH3)3 induced by Si-2p core-level ionizations studied with photoelectron photoion coincidence (PEPICO) spectroscopy, Auger photoelectron coincidence spectroscopy (APECS) and Auger electron photoion coincidence (AEPICO) spectroscopy

Published:2013-01 Issue: Volume:607 Page:174-180
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Mase Kazuhiko,Kobayashi Eiichi,Nambu Akira,Kakiuchi Takuhiro,Takahashi Osamu,Tabayashi Kiyohiko,Ohshita Joji,Hashimoto Shogo,Tanaka Masatoshi,Nagaoka Shin-ichi

Funder

PRESTO (Structure Function and Measurement Analysis)

Japanese Ministry of Education, Culture, Sports, Science and Technology

Photon Factory Program Advisory Committee

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference64 articles.

1. Desorption from Surfaces by Slow‐Electron Impact

2. INTERACTION OF SLOW ELECTRONS WITH CHEMISORBED OXYGEN

3. Electron-stimulated desorption: Principles and applications