Thin film characterisation of chromium disilicide
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference23 articles.
1. Characterization of chromium silicide thin layer formed on amorphous silicon films
2. Electrical properties of CrSix, Cr/CrSix/Cr/CrSix, and CrSix/Si/CrSix/Si sputtered on alumina plates
3. Structure and properties of CrSi2/Si multilayers
4. Ion beam synthesis of chromium silicide on porous silicon
5. Molecular beam epitaxy of monotype CrSi2 on Si(111)
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1. Growth of Magnetron-Sputtered Ultrathin Chromium Films: In Situ Monitoring and Ex Situ Film Properties;Coatings;2023-02-02
2. Properties of CrSi2 Layers Obtained by Rapid Heat Treatment of Cr Film on Silicon;Nanomaterials;2021-06-30
3. Effect of the Deposition Time and Heating Temperature on the Structure of Chromium Silicides Synthesized by Pack Cementation Process;Corrosion and Materials Degradation;2021-05-11
4. XPS spectra of chromium monosilicides and disilicides obtained by in situ fractured clean surfaces;Surface and Interface Analysis;2020-06-24
5. Effect of amorphous silicon interlayer on the adherence of amorphous hydrogenated carbon coatings deposited on several metallic surfaces;Surface and Coatings Technology;2018-06
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