Annealing effects and structural evolution of Si/Cu(111) ultrathin films-Reference-Cited by-同舟云学术

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Annealing effects and structural evolution of Si/Cu(111) ultrathin films

Published:2007-09 Issue:18 Volume:601 Page:4265-4269
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Tsay J.S.,Yang A.B.,Wu C.N.,Shiu F.S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference30 articles.

1. Engineering atomic and molecular nanostructures at surfaces

2. Influence of iron–silicon interaction on the growth of carbon nanotubes produced by chemical vapor deposition

3. Ferroelectricity at the Nanoscale: Local Polarization in Oxide Thin Films and Heterostructures

4. Morphology Investigation of Electrolessly Deposited Ag Film on Ag-Activated p-Type Silicon(111) Wafer

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1. Growth of Silicon Nano-ribbons on Ag(110): State of the Art;Silicene;2016

2. Thermal Stability of Ultralow-k Dielectric Multi-Layer Films;Nanoscience and Nanotechnology Letters;2013-02-01

3. Growth and alloying of thin film Te on Cu(111);Surface Science;2012-09

4. Effects of Si capping layers on the properties of ultrathin Co/Ir(111) films;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2009-11

5. Magnetic properties of ultrathin Si/Co/Ir(111) films;Journal of Physics: Condensed Matter;2008-09-25

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