Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference26 articles.
1. Studies in differential charging
2. Effects of a depth‐dependent specimen potential on x‐ray photoelectron spectroscopic data
3. Measurements of interface state density by X-ray photoelectron spectroscopy
4. Differential Charging in XPS. Part I: Demonstration of Lateral Charging in a Bulk Insulator Using Imaging XPS
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