Reply to a comment of J. Zemek, Prague, regarding the paper “resolving the depth coordinate in photoelectron spectroscopy – comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system”-Reference-Cited by-同舟云学术

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Reply to a comment of J. Zemek, Prague, regarding the paper “resolving the depth coordinate in photoelectron spectroscopy – comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system”

Published:2008-12 Issue:23 Volume:602 Page:3634-3635
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Merzlikin S.V.,Tolkachev N.N.,Strunskus T.,Witte G.,Glogowski T.,Wöll C.,Grünert W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference6 articles.

1. Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system

2. Comment on “Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system” by S.V. Merzlikin et al. [Surf. Sci. 602 (2008) 755]

3. Angular-resolved photoelectron spectroscopy of corrugated surfaces

4. Photoelectron spectroscopy from randomly corrugated surfaces

5. Applicability of magic angle for angle-resolved X-ray photoelectron spectroscopy of corrugated SiO2/Si surfaces: Monte Carlo calculations

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