Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system-Reference-Cited by-同舟云学术

Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system

Published:2008-02 Issue:3 Volume:602 Page:755-767
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Merzlikin Sergiy V.,Tolkachev Nikolay N.,Strunskus Thomas,Witte Gregor,Glogowski Thomas,Wöll Christof,Grünert Wolfgang

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference30 articles.

1. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Werner,2003

2. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Tougaard,2003

3. Quantitative analysis of XPS intensities for supported catalysts

4. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

5. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy;Cumpson,2003

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