Total-reflection X-ray fluorescence analysis using special X-ray sources
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Reference20 articles.
1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis
2. A method for quantitative X-ray fluorescence analysis in the nanogram region
3. Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amounts
4. An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level
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2. Trends and Future Prospects;Total-Reflection X-Ray Fluorescence Analysis and Related Methods;2014-12-19
3. Instrumentation for TXRF and GI-XRF;Total-Reflection X-Ray Fluorescence Analysis and Related Methods;2014-12-19
4. Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis;J. Anal. At. Spectrom.;2012
5. Total reflection X-ray fluorescence analysis using polycapillaries. A comparison with conventional setups;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-12
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