Author:
Ferré A,Isern E,Rius J,Rodrı́guez-Montañés R,Figueras J
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference161 articles.
1. CMOS scaling for high performance and low power – the next ten years;Davari;Proc. IEEE,1995
2. National Technology Roadmap for Semiconductors 1997, Available at http://www.sematech.org/public/roadmap/index.htm, 1997.
3. Future CMOS scaling and reliability;Hu;Proc. IEEE,1993
4. M.W. Levi, CMOS is most testable, Int. Test Conf., 1981, pp. 217–220.
5. IDDQ testing: issues present and future;Soden;IEEE Des. Test Comput.,1996
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献