1. Image analysis and graphs;Harlow;Computer Graphics and Image Processing,1973
2. New Progress in Artificial Intelligence;Winston;MIT AI Lab., AI-TR-310,1974
3. A process for detecting defects in complicated patterns;Ejiri;Computer Graphics and Image Processing,1973
4. L. Norton-Wayne and W. J. Hill, The automatic classification of defects on moving surfaces, Proc. 2nd Int. Jt Conf. on Pattern Recognition, Aug. 13–15, 1974, Copenhagen, Denmark, pp. 476–478.
5. I. G. Logan and J. E. S. Macleod, An application of pattern recognition algorithms to the automatic inspection of strip metal surfaces, Ibid. 286–290.