A process for detecting defects in complicated patterns-Reference-Cited by-同舟云学术

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A process for detecting defects in complicated patterns

Published:1973-12 Issue:3-4 Volume:2 Page:326-339
ISSN:0146-664X
Container-title:Computer Graphics and Image Processing
language:en
Short-container-title:Computer Graphics and Image Processing

Author:

Ejiri Masakazu,Uno Takeshi,Mese Michihiro,Ikeda Sadahiro

Publisher

Elsevier BV

Subject

General Earth and Planetary Sciences,General Environmental Science

Reference2 articles.

1. Distance functions on digital pictures;Rosenfeld;Pat. Recog.,1968

2. A. Rosenfeld and C. M. Park, Noise cleaning in digital pictures, EASCON ’69 Record, 264–273.

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