Accurate image registration method for PCB defects detection
Author:
Affiliation:
1. College of Electronic Information and Optical Engineering, Nankai UniversityTianjinPeople's Republic of China
2. Key Laboratory of Machine PerceptionPeking University, Shenzhen Graduate SchoolShenzhenPeople's Republic of China
Publisher
Institution of Engineering and Technology (IET)
Subject
General Engineering,Energy Engineering and Power Technology,Software
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/joe.2018.8272
Reference21 articles.
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3. WangW. YanX. WangZ.et al.: ‘A robust affine invariant point extraction algorithm for image registration’.Int. Symp. Computational Intelligence and Design Hangzhou China December 2017 pp.79–82
4. Automatic panoramic image stitching using invariant features;Brown M.;Int. J. Comput. Vis.,2007
5. YangW. HanC. SunH.et al.: ‘Registration of high resolution SAR and optical images based on multiple features’.Int. Geoscience and Remote Sensing Symp. Seoul South Korea July 2005 pp.3542–3544
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