X-ray topographic investigation of the deformation field around spots irradiated by FLASH single pulses-Reference-Cited by-同舟云学术

X-ray topographic investigation of the deformation field around spots irradiated by FLASH single pulses

Published:2011-10 Issue:10 Volume:80 Page:1036-1040
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Wierzchowski W.,Wieteska K.,Balcer T.,Klinger D.,Sobierajski R.,Żymierska D.,Chalupský J.,Hájková V.,Burian T.,Gleeson A.J.,Juha L.,Tiedtke K.,Toleikis S.,Vyšín L.,Wabnitz H.,Gaudin J.

Publisher

Elsevier BV

Subject

Radiation

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4. Conductors, semiconductors, and insulators irradiated with short-wavelength free-electron laser;Krzywinski;J. Appl. Phys.,2007

5. Structure modifications in silicon irradiated by ultra-short pulses of XUV free electron laser;Pelka;J. Alloys Compd.,2004

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1. Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-12

2. Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography;Radiation Physics and Chemistry;2013-12

3. Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids;Journal of Instrumentation;2013-02-14