Simulation study of single-event burnout in hardened GaN MISFET
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Published:2023-12
Issue:
Volume:213
Page:111244
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ISSN:0969-806X
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Container-title:Radiation Physics and Chemistry
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language:en
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Short-container-title:Radiation Physics and Chemistry
Author:
Fei Xin-XingORCID,
Wang Yong,
Sun Biao,
Xing Jun,
Wei Wei,
Li Chang-You