Synchrotron radiation based micro X-ray fluorescence analysis of the calibration samples used in surface sensitive total reflection and grazing emission X-ray fluorescence techniques-Reference-Cited by-同舟云学术

Synchrotron radiation based micro X-ray fluorescence analysis of the calibration samples used in surface sensitive total reflection and grazing emission X-ray fluorescence techniques

Published:2013-12 Issue: Volume:93 Page:117-122
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Kubala-Kukuś A.,Banaś D.,Pajek M.,Szlachetko J.,Jagodziński P.,Susini J.,Salomé M.

Publisher

Elsevier BV

Subject

Radiation

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4. Trends in total reflection X-ray fluorescence spectrometry for metallic contamination control in semiconductor nanotechnology;Hellin;Spectrochim. Acta B,2006

5. Depth profiles of Al impurities implanted in Si wafers determined by means of the high resolution grazing emission X-ray fluorescence technique;Kayser;Spectrochim. Acta B,2010

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