Author:
Haro Miguel Sofo,Bessia Fabricio Alcalde,Pérez Martín,Blostein Juan Jerónimo,Balmaceda Darío Federico,Berisso Mariano Gomez,Lipovetzky José
Reference27 articles.
1. X-ray micrographic imaging system based on cots cmos sensors;Alcalde Bessia;Int. J. Circuit Theory Appl.,2018
2. AMPTEK. http://amptek.com/products/xr-100sdd-silicon-drift-detector. Accessed: 2019-05-04.
3. Arducam. http://www.arducam.com/arducam-usb-camera-shield-released/. Accessed: 2018-12-5.
4. Calculations of mean free paths and stopping powers of low energy electrons (¡10 kev) in solids using a statistical model;Ashley;IEEE Trans. Nucl. Sci.,1976
5. Displacement damage in cmos image sensors after thermal neutron irradiation;Bessia;IEEE Trans. Nucl. Sci.,2018
Cited by
16 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献