Author:
Kopešťanský J.,Tykva R.,Staněk S.
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Cited by
2 articles.
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1. The noise reduction of silicon detectors by wafer analyses and technological procedures;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-10
2. PC-controlledin situ evaluation of multilabelling with beta tracers in biological samples;Journal of Radioanalytical and Nuclear Chemistry Articles;1995-09