Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer langmuir-blodgett films
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
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1. Chemically alternating langmuir-blodgett thin films as a model for molecular depth profiling by mass spectrometry;Journal of the American Society for Mass Spectrometry;2008-01-01
2. Sputtering of organic molecular monolayers self-assembled onto Ag(111) and Au(111) surfaces;Vacuum;2002-07
3. Substrate effect in sputtering of self-assembled monolayers: hexadecanethiol on Au(111) and Ag(111);Surface Science;1999-02
4. Surface characterization by means of quantitative evaluation of MIES data;Journal of Electron Spectroscopy and Related Phenomena;1998-11
5. Experimental investigations of spontaneous desorption;International Journal of Mass Spectrometry and Ion Processes;1989-11
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