Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
9 articles.
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1. TOF-SIMS: Accurate mass scale calibration;Journal of the American Society for Mass Spectrometry;2006-04-01
2. Computer simulations of surface analysis using ion beams;Progress in Surface Science;2006-01
3. Interpretation of TOF–SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation;Applied Physics A;2005-06
4. Modelling of cluster emission from metal surfaces under ion impact;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;2003-11-25
5. Kinetic energy distributions of sputtered indium atoms and clusters;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-11