Oxygen isotopic exchange occurring during dry thermal oxidation of 6H SiC
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference14 articles.
1. Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiC
2. An 18O Study of the Oxidation Mechanism of Silicon in Dry Oxygen
3. Depth profiling with narrow resonances of nuclear reactions: Theory and experimental use
4. A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing
5. A very narrow resonance in 18O(p, α)15N near 150 keV: Application to isotopic tracing. II. High resolution depth profiling of 18O
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