Absolute mass thickness determination of thin samples by X-ray fluorescence analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
1. Absolute x-ray fluorescence method for the determination of metal thicknesses by intensity ratio measurements
2. Absolute method for determination of metallic film thickness by X-ray fluorescence
3. Thickness determination of thin solid films by angle-resolved X-ray fluorescence spectrometry using monochromatized synchrotron radiation
4. R. Tertian, F. Claisse, Principles of Quantitative X-Ray Fluorescence Analysis, Heyden, London
5. R.A. Barrea, Doctoral Thesis, Universidad Nacional de Córdoba, 1995
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