Author:
Mori Hidenobu,Hirao Toshio,Stuart Laird Jamie,Onoda Shinobu,Kamiya Tomihiro,Itoh Hisayoshi,Okamoto Tsuyoshi,Koizumi Yoshiharu
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Development of single-ion hit techniques and their applications at TIARA of JAERI Takasaki;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
2. Observation of single-ion induced charge collection in diode by a heavy ion microbeam system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-09
3. Displacement damage degradation of ion-induced charge in Si pin photodiode;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-05
4. Modeling of transient charge collection induced by an angled single ion strike;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-05
5. Recent studies of single-event phenomena in devices using the heavy-ion microbeam at JAERI;RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605)