Intrinsic residual stresses in metal films synthesized by energetic particle deposition
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
1. Intrinsic stress in sputter-deposited thin films
2. Stress-related effects in thin films
3. E.S. Machlin, Materials Science in Microelectronics – The Relationships between Thin Film Processing and Structure, Vol. 1, GIRO Press, New York, 1995, pp. 157–184
4. Properties and microstructure of tungsten films deposited by ion-assisted evaporation
5. Stresses in thin films: The relevance of grain boundaries and impurities
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Energetically deposited nano-composite films of high speed steel and titanium nitride;Surface and Coatings Technology;2014-11
2. He+ ion irradiation response of Fe–TiO2 multilayers;Journal of Nuclear Materials;2013-04
3. Evaluation of stress during and after sputter deposition of Cu and Ta films;Surface and Coatings Technology;2010-12
4. Ion Beam Assisted Deposition;Materials Processing Handbook;2007-03-28
5. Cathodic Arc Evaporation and its Applications to Thin-Film Synthesis;Materials Surface Processing by Directed Energy Techniques;2006
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3