Stresses in thin films: The relevance of grain boundaries and impurities
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Recent developments in the study of mechanical properties of thin films
2. The origins of stress in thin nickel films
3. An Apparatus for Measuring Stress in Thin Films
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