Author:
Osipowicz T.,Sanchez J.L.,Orlic I.,Watt F.,Kolachina S.,Chan D.S.H.,Phang J.C.H.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
4 articles.
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1. Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-04
2. Effect of rapid thermal annealing on the composition of Au/Ti/Al/Ti ohmic contacts for GaN-based microdevices;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07
3. A review of ion beam induced charge microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-11
4. Ion beam induced charge microscopy studies of power diodes;Journal of Physics: Condensed Matter;2003-12-22