Author:
Takai M,Nakayama K,Takaoka H,Iwamatsu T,Yamaguchi Y,Maegawa S,Nishimura T,Kinomura A,Horino Y
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
6 articles.
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1. Difference of soft error rates in SOI SRAM induced by various high energy ion species;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-02
2. Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90nm;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-06
3. Reliability study of bulk and SOI SRAMs using high energy nuclear probes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04
4. Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-09
5. Suppression of floating body effects in SOI–MOSFET studied using nuclear microprobes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-07