Author:
Rodríguez A.,Rodríguez T.,Kling A.,Soares J.C.,da Silva M.F.,Ballesteros C.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
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1. On the use of MEIS cartography for the determination of Si 1–x Ge x thin-film strain;Thin Solid Films;2016-07
2. Regrowth characteristics of SiGe/Si by IBIEC and SPEG;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07
3. High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-05