Effect of light-soaking on the hydrogen effusion mechanisms in polymorphous silicon thin film structures

Author:

Hamui L.,Monroy B.M.,Roca i Cabarrocas P.,Santana G.

Funder

DGAPA-UNAM PAPIIT

CONACyT Mexico

SENER-CONACyT

CONACyT

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science

Reference36 articles.

1. Structural, optical and electronic properties of hydrogenated polymorphous silicon films deposited at 150°C;Butté;J. Non-Cryst. Solids,2000

2. Structural and electronic properties of hydrogenated polymorphous silicon films deposited at high rate;Soro;J. Appl. Phys.,2011

3. Influence of light-soaking treatment on the optoelectronic properties of polymorphous silicon thin films to be used in solar cells;Alvarez-Macias,2013

4. Hydrogen in silicon: a discussion of diffusion and passivation mechanisms;Sopori;Sol. Energy Mater. Sol. Cells,1996

5. Reversible conductivity changes in discharge produced amorphous Si;Staebler;Appl. Phys. Lett.,1977

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