Focused ion beam milling of carbon fibres
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference30 articles.
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4. A three beam approach to TEM preparation using in-situ low voltage argon ion final milling in a FIB-SEM instrument;Principe;Microsc. Microanal.,2005
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1. Making the most of your electrons: Challenges and opportunities in characterizing hybrid interfaces with STEM;Materials Today;2021-11
2. Focused ion beam preparation and microscopy investigation of secondary layer on carbon-bonded alumina filter after steel contact;Ceramics International;2018-08
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