Investigation of thin film end-termination on multilayer ceramic capacitors-Reference-Cited by-同舟云学术

Investigation of thin film end-termination on multilayer ceramic capacitors

Published:2008-07 Issue:1 Volume:110 Page:100-105
ISSN:0254-0584
Container-title:Materials Chemistry and Physics
language:en
Short-container-title:Materials Chemistry and Physics

Author:

Lee Ying-Chieh

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science

Reference14 articles.

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3. Interfacial development and microstructural imperfection of multilayer ceramic chips with Ag/Pd electrodes;Zuo;Ceram. Int.,2001

4. Preparation, microstructureal development and dielectric properties of Pb(Mg1/3Nb2/3)O3–Pb(TixZr1−x)O3 multilayer ceramic capacitors;Villegas;J. Mater. Sci.,1994

5. Encapsulation of Ag films on SiO2 by Ti reactions using Ag–Ti alloy/bilayer structures and an NH3 ambient;Alford;Appl. Phys. Lett.,1996

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