Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes-Reference-Cited by-同舟云学术

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Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes

Published:2017-09 Issue: Volume:683 Page:186-192
ISSN:0009-2614
Container-title:Chemical Physics Letters
language:en
Short-container-title:Chemical Physics Letters

Author:

Plemmons Dayne A.,Flannigan David J.

Funder

National Science Foundation

Arnold and Mabel Beckman Foundation

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Reference47 articles.

1. 4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY

2. Mapping Atomic Motions with Ultrabright Electrons: The Chemists' Gedanken Experiment Enters the Lab Frame

3. Modern electron microscopy resolved in space, energy and time

4. Ultrafast imaging of isolated molecules with electron diffraction

5. Ultrafast electron microscopy in materials science, biology, and chemistry

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